Internal Discontinuities
Identify internal discontinuities within low-density aerospace structures.
Single-sided, non-contact terahertz inspection for low-density aerospace materials, composite structures, honeycomb, insulation materials and thermal protection coating structures.
Terahertz inspection reveals internal discontinuities, material density variation, bond anomalies and thickness variation in low-density dielectric materials.
Identify internal discontinuities within low-density aerospace structures.
Detect changes in material density and dielectric properties.
Identify debonding and bond anomalies at internal interfaces.
Measure thickness variation and review structural uniformity.
Use internal reflections to assess structural integrity and interface condition.
Perform single-sided, non-contact inspection at predefined locations.
Non-contact THz inspection for ceramics, honeycomb, radome structures, insulation materials and thermal protection coating structures.
Non-contact GFRP thickness measurement and internal defect detection.
Non-contact TBC thickness measurement and hidden defect detection.
Non-contact rubber thickness, bond integrity and hidden defect detection.
Non-contact inspection of silica-based thermal protection materials and hidden defects.
Terahertz NDT for non-contact rubber thickness, bond integrity and quality control.
THz pulses reflect from internal interfaces inside low-density aerospace structures. Time separation and amplitude changes reveal structural integrity, interface condition and hidden discontinuities.
THz pulses reflect from internal interfaces inside low-density aerospace structures. Time separation and amplitude changes reveal structural integrity, interface condition and hidden discontinuities.
Single-sided, non-contact THz inspection at predefined locations.
Identify reflections from the outer skin, bond line, core and inner structure. Detect debonding, cracks and thickness variation.
Generate inspection results for defect localization, structural uniformity review and report. Provide digital inspection outputs and clear reporting.
| Thickness | Multi-layer coating thickness Coating uniformity Density variation |
| Flaw Detection (Imaging) | Surface defect detection Honeycomb bond inspection Composite adhesive bond inspection Changes in dielectric properties |
| Low-Density Materials | Cork, Silica, Rubber, Inhibition, Aramid, Fiber Reinforced Plastic (FRP), and Siloxane-based materials Note: All dielectric materials are feasible for inspection. |
| SCAN | Single-sided, non-contact THz inspection at predefined locations. |
| DETECT | Identify reflections from the outer skin, bond line, core, and inner structure. Detect debonding, cracks, and thickness variation. |
| ANALYSE & REPORT | Generate inspection results for defect localization, structural uniformity review, and report. Provide digital inspection outputs and clear reporting. |
| Spectral Range | 0.1–4 THz |
| Thickness Range | 20 µm–40 mm (RI=1.5) |
| Measurement Spot | ~ 2 mm |
| Data | A, B, C Scan and FFT |
| Working Distance | 25–100 mm |
| Probe Configuration | Handheld, Scanner Mountable, Cobot-Integrable |
| Thickness Accuracy | ±1 µm |
| Power | 110/240 VAC / Optional Battery |
| Operating Temp | 15–40°C |
| Reports | PDF and Excel Formats |
Measurement compatibility and performance depend on material composition, density, geometry, surface condition and application.
Explore technical resources, application insights and publications to understand how terahertz technology can support advanced inspection and measurement.
Explore terahertz-based inspection for aerospace materials, coatings, composites and low-density structures.
Explore Applications →Learn how THz technology can support multi-layer coating inspection and advanced automotive quality control.
Explore Applications→Access technical research, white papers and publications covering terahertz technology, NDT and material characterization.
View Journals →Explore TeraNIM-Aero for non-contact THz inspection of low-density aerospace materials and structures.
